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Ieee Design & Test of Computers

Journal Abbreviation: IEEE DES TEST COMPUT
Journal ISSN: 0740-7475

About Ieee Design & Test of Computers

    IEEE Design & Test of Computers offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards. IEEE Design & Test of Computers is published by the IEEE Computer Society in technical cosponsorship with the IEEE Circuits and Systems Society.
Year Impact Factor (IF) Total Articles Total Cites
2023 (2024 update) - -
2022 - -
2021 - -
2020 - -
2019 - -
2018 - -
2017 - -
2016 - -
2015 - -
2014 - -
2013 - -
2012 1.623 41 847
2011 1.386 43 934
2010 0.957 34 926

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